Products

TEST SOCKETS

We have a wide array of test socket designs. Please visit our page in order to view the various types of sockets we offer and to learn more about them. Standard and advanced contact elements are available.

NEW - TWISTLESS TECHNOLOGY

Our new cantilever design for vertical probing concepts have a robust probe tips that do not bend when touched! This new product is very reliable with lifetime of over 1.5 million touchdowns. Here are a few other features and advantages of this new technology:

Zero scrub mark
Custom BCF Control
Flexible probe tip depth
Beam length control +/-0.001"
Probes with solid connected to PCB
Agile designs to fit on different pad arrays
Entire probe has no twist and planarity adjustment

CANTILEVER PROBECARD TECHNOLOGY

Probecard designs from SEMItest have the capability to be tested in high temperature settings, control beam length and balance contact force, as well as be produced with multiple sites in both standard and shelf designs. These designs can go up to 1000 pin counts and are able to support high parallelism testing.